A Model-Based Safety Flow for Automotive Semiconductor Products in Battery Management Applications

28 aug. 2019 16:00 — 17:00 Add this to Calendar

Because they are tiny and virtually invisible, it’s easy to overlook the central importance of the semiconductors that underlie reliable automotive performance today. But these small systems allow larger electronics networks to control every aspect of a car’s performance — including the batteries that drive many of the critical systems in the vehicle.

In this webinar, NXP engineers present their work on a model-based flow to develop safety-related automotive semiconductor products using ANSYS medini for semiconductors. Attend this event to learn how a seamless top-down methodology helps NXP engineers handle demanding safety challenges. It enables a consistent integration of all safety deliverables from safety goals down to the architecture as well as extensive safety analysis. NXP presenters will use an automotive battery management IC as an example to describe the challenges and the individual flow steps.

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